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New microscope li idth calibration standard nbs SRM475


This is a Standard Reference Material created by The National Bureau of Standards (NBS) - now called NIST (National Institute of Standards and Technology).
It is considered a PRIMARY STANDARD, and according to the NIST documentation, it DOES NOT REQUIRE PERIODIC RE-CALIBRATION. This is because the linewidths are inherently very stable for long periods (for its useful life).
This Standard Reference Material sold new for nearly $4000, and is no longer available from NIST; and to my best knowledge, there are no other used units currently available. So it is somewhat a "one-of-a-kind."
This would be very useful for a small calibration lab that is interested in expanding capabilities to certifying measuring microscopes, or with an adequate resolution measuring microscope, to use as a comparison standard for certifying/re-certifying other less accurate linewidth standards.
DESCRIPTION: This is an NBS (NIST) SRM475 (Standard Reference Material 475), Anti-reflecting Chromium, Optical Linewidth Measurement Standard with nominal linewidths ranging from 0.5 to 12.0 um. This SRM is used, but has been stored in a climate controlled metrology laboratory, and its use was in a state-of-the-art semiconductor wafer fab facility (clean room environment). Although I must call it "used", it has had very little actual usage, as it was originally purchased for support of semiconductor measuring instruments, and for the most part was never used. So it has sat in a cabinet in a laboratory until the wafer fab closed (where I rescued it - knowing its intrinsic value).
PLEASE SEND ME A MESSAGE FOR ANY QUESTIONS. I COULD EVEN ATTEMPT TO TAKE OTHER DETAIL PICTURES IF NEEDED TO ASSIST IN UNDERSTANDING APPLICABILITY FOR YOUR REQUIREMENTS.



New microscope li idth calibration standard nbs SRM475 New microscope li idth calibration standard nbs SRM475 New microscope li idth calibration standard nbs SRM475 New microscope li idth calibration standard nbs SRM475